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  • Noise in Nanoscale Semiconductor Devices

    Edición de Tibor Grasser ...
    Series series Engineering (R0)
    This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more ... Leer más

    $80.09 USD

  • Hot Carrier Degradation in Semiconductor Devices

    Edición de Tibor Grasser ...
    Series series Engineering (R0)
    This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, ... Leer más

    $98.09 USD

  • Bias Temperature Instability for Devices and Circuits

    Edición de Tibor Grasser ...
    Series series Engineering (R0)
    This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, ... Leer más

    $98.09 USD

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  • Advanced Materials

    Techniques, Physics, Mechanics and Applications

    Series series Springer Nature Proceedings excluding Computer Science
    This book presents 50 selected peer-reviewed reports from the 2016 International Conference on “Physics and Mechanics of New Materials and Their Applications”, PHENMA 2016 (Surabaya, Indonesia, 19–22 July, 2016). The Proceedings are devoted to processing techniques, physics, mechanics, and applications of advanced materials. As such, they examine a wide spectrum of nanostructures, ferroelectric ... Leer más

    $287.99 USD

  • CMOS Test and Evaluation

    A Physical Perspective

    Series series Engineering (R0)
    CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers ... Leer más

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  • Electromigration Modeling at Circuit Layout Level

    Series series Engineering (R0)
    Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability. This brief ... Leer más

    $49.49 USD

  • Semiconductor Technologies in the Era of Electronics

    Series series Engineering (R0)
    Technological advances in the field of materials, devices, circuits, and systems began by the discovery of new properties of objects, or the entrepreneurship with the applications of unique or practical concepts for commercial goods. To implement products using these findings and challenges textbook knowledge is usually sufficient. Semiconductor Technologies in the Era of Electronics therefore ... Leer más

    $89.99 USD

  • Research on the Radiation Effects and Compact Model of SiGe HBT

    de Yabin Sun ...
    Series series Engineering (R0)
    This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by ... Leer más

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  • Microwave Electronics

    Series series Engineering (R0)
    This book describes the physical basis of microwave electronics and related topics, such as microwave vacuum and microwave semiconductor devices.It comprehensively discusses the main types of microwave vacuum and microwave semiconductor devices, their principles of action, theory, parameters and characteristics, as well as ways of increasing the frequency limit of various devices up to the ... Leer más

    $107.99 USD

  • Advanced Materials for Integrated Optical Waveguides

    Series series Physics and Astronomy (R0)
    This book provides a comprehensive introduction to integrated optical waveguides for information technology and data communications. Integrated coverage ranges from advanced materials, fabrication, and characterization techniques to guidelines for design and simulation. A concluding chapter offers perspectives on likely future trends and challenges. The dramatic scaling down of feature sizes has ... Leer más

    $143.99 USD

  • Plenty of Jobs Unfold for PCB Designing

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    Lack of quality designers and preference for VLSI and embedded bring many new opportunities to the field of PCB designing. In this article, we cover the kind of opportunities available in India, the skills expected and pay packages offered, plus some suggestions from industry experts ... Leer más

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  • Exploring Memory Hierarchy Design with Emerging Memory Technologies

    de Guangyu Sun ...
    Series series Engineering (R0)
    This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques described offer advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the “memory wall.” The ... Leer más

    $89.09 USD